Scanning Microscopy Station SPM (NT-MDT)

Available techniques:
- Atomic Force Microscopy (AFM) with:
- (Contact mode) Force modulation technique. Topography and local elasticity images.
- (Contact mode) Contact Capacitance Technique. Topography and local capacitance images.
- (Contact mode) Lateral force imaging.
- (Contact mode) Piezo Force Microscopy.
- (Contact mode) Spreading resistance imaging.
- (Semicontact mode) Phase contrast imaging.
- Lithography operations. Two ways for lithography impact (BV/SP). Two ways for lithography execution (Raster/Vector).
- Heating stage operations.
- Operations in liquid.
Double-pass techniques:
- Magnetic Force Microscopy (MFM).
- Electrostatic Force Microscopy (EFM).
- Scanning Kelvin Microscopy (SKM).
- Scanning Capacitance Microscopy (SCM).
Scanning Tunneling Microscopy (STM) mode.
Nanoindentation.