Set-up for electrical, photoelectrical, Hall effect and magnetoresistance characterizations of semiconductor nanostructured materials
Acurate measurements are performed: (photo)current – voltage characteristics at different temperatures (10-500K); current – temperature…
Measurement of thermoelectric properties system
The system for measuring the thermoelectric properties is designed to measure properties at high temperatures…
Electrical properties measurements station
The electrical properties measurements station is designated for characterization at varying temperatures and magnetic fields…
Experimental Cluster for Surface and Interface Science
The Cluster represents one of the most complex such systems in Europe, makes possible the preparation…
Low energy and Photoelectron Electron Microscope LEEM-PEEM (Specs)
The setup operates in ultrahigh vacuum (below 2 x 10-10 mbar). Methods available: Low energy…
Scanning Microscopy Station SPM (NT-MDT)
Available techniques: Atomic Force Microscopy (AFM) with: (Contact mode) Force modulation technique. Topography and local…
Ultra High Vacuum System for XPS/UPS/AES (Specs)
CHARACTERIZATION METHODS X-ray Photoelectron Spectroscopy (XPS) – a spectroscopic technique based on photoelectric effect that measures the…
Gas chromatograph with GC-MS mass spectrometer
The gas chromatograph with GC-MS mass spectrometer is capable of determining and analyzing molecular species…
XPS photoelectron spectroscopy unit with facilities for treatment of samples at high pressure and temperature
XPS photoelectron spectroscopy unit, with facilities for the treatment of samples at high pressure and…
UV-VIS-NIR Spectrophotometer, Lambda 90 ( Perkin Elmer )
Technical details : excitation sources: tungsten and deuterium lamps double monochromator equipped with 1140tr/mm (UV/VIS…